At Cogent Purchasing, Itt Corporation, Vishay Dale Electronics electrical connector parts are just one of the numerous types of electrical connectors we offer parts of Test Points Test Fixture for Sirenza XD Module Series, Testboard for ATM, ESCON, Fibre Channel and Gigabit Ethernet 1x9 Transceivers, Utilizing one of the worldÆs brightest AllnGaP technologies LED, TELUX / Utilizing one of the worldÆs brightest (AS) AllnGaP technologies (OMA) / High luminous flux. With manufacturers like Itt Corporation, Vishay Dale Electronics producing parts such as XD010-EVAL, V23806-S84-Z4, V23806-S84-Z3, TLWY8900, TLWR9922, we are ready to be your one-stop-shop for electrical connectors. Our dedicated account managers can devise customized solutions for the procurement issues you face, such as sourcing hard-to-find or obsolete parts for you. When you’re ready to get started, you can upload a document listing your Test Points parts requirements, or submit an Instant RFQ to begin.
Part No | Manufacturer | Description | QTY | RFQ |
---|---|---|---|---|
XD010-EVAL | itt corporation | test fixture for sirenza xd module series | Avl | RFQ |
V23806-S84-Z4 | itt corporation | testboard for atm, escon, fibre channel and gigabit ethernet 1x9 transceivers | Avl | RFQ |
V23806-S84-Z3 | itt corporation | testboard for atm, escon, fibre channel and gigabit ethernet 1x9 transceivers | Avl | RFQ |
TLWY8900 | vishay dale electronics | utilizing one of the worldæs brightest allngap technologies led | Avl | RFQ |
TLWR9922 | itt corporation | telux / utilizing one of the worldæs brightest (as) allngap technologies (oma) / high luminous flux | Avl | RFQ |
TLWR9921 | itt corporation | telux / utilizing one of the worldæs brightest (as) allngap technologies (oma) / high luminous flux | Avl | RFQ |
TLWR9920 | itt corporation | telux / utilizing one of the worldæs brightest (as) allngap technologies (oma) / high luminous flux | Avl | RFQ |
TLWR992 | itt corporation | telux / utilizing one of the worldæs brightest (as) allngap technologies (oma) / high luminous flux | Avl | RFQ |
TLWR9901 | vishay dale electronics | utilizing one of the worldæs brightest (as) allngap clear, non diffused led | Avl | RFQ |
TLWR9900 | vishay dale electronics | utilizing one of the worldæs brightest (as) allngap clear, non diffused led | Avl | RFQ |
TLWR990 | vishay dale electronics | utilizing one of the worldæs brightest (as) allngap clear, non diffused led | Avl | RFQ |
TLWR8900 | vishay dale electronics | utilizing one of the worldæs brightest allngap technologies led | Avl | RFQ |
TEW5009 | itt corporation | t1/cept/isdn test transformer | Avl | RFQ |
TEST2600-08 | vishay dale electronics | silicon npn phototransistor, rohs compliant | Avl | RFQ |
TEST2600 | vishay dale electronics | silicon npn phototransistor | Avl | RFQ |
TB520-XX | itt corporation | test board for chip evaluation and layout recommendations | Avl | RFQ |
TB502-3X-520-XX | itt corporation | test board for chip evaluation and layout recommendations | Avl | RFQ |
TB502-3X | itt corporation | test board for chip evaluation and layout recommendations | Avl | RFQ |
TB502-02 | itt corporation | layout recommendation and test board for pll502-02 | Avl | RFQ |
TB502 | itt corporation | test board for chip evaluation and layout recommendations | Avl | RFQ |
TB1221L | other | test board accelerometers | Avl | RFQ |
TB1221J | other | test board accelerometers | Avl | RFQ |
TB1221 | other | test board accelerometers | Avl | RFQ |
TB1210L | other | test board accelerometers | Avl | RFQ |
TB1210J | other | test board accelerometers | Avl | RFQ |
TB1210 | other | test board accelerometers | Avl | RFQ |
TB1010L | other | test board accelerometers | Avl | RFQ |
TB1010J | other | test board accelerometers | Avl | RFQ |
TB1010 | other | test board accelerometers | Avl | RFQ |
SN74BCT8374ANTE4 | texas instruments | scan test devices with octal d-type edge-triggered flip-flops | Avl | RFQ |
SN74BCT8374ANT | texas instruments | scan test devices with octal d-type edge-triggered flip-flops | Avl | RFQ |
SN74BCT8374ADWRG4 | texas instruments | scan test devices with octal d-type edge-triggered flip-flops | Avl | RFQ |
SN74BCT8374ADWRE4 | texas instruments | scan test devices with octal d-type edge-triggered flip-flops | Avl | RFQ |
SN74BCT8374ADWR | texas instruments | scan test devices with octal d-type edge-triggered flip-flops | Avl | RFQ |
SN74BCT8374ADWG4 | texas instruments | scan test devices with octal d-type edge-triggered flip-flops | Avl | RFQ |
SN74BCT8374ADWE4 | texas instruments | scan test devices with octal d-type edge-triggered flip-flops | Avl | RFQ |
SN74BCT8374ADW | texas instruments | scan test devices with octal d-type edge-triggered flip-flops | Avl | RFQ |
SN74BCT8374A | texas instruments | scan test devices with octal d-type edge-triggered flip-flops | Avl | RFQ |
SN74BCT8373ANTE4 | texas instruments | scan test devices with octal d-type latches | Avl | RFQ |
SN74BCT8373ANT | texas instruments | scan test devices with octal d-type latches | Avl | RFQ |
SN74BCT8373ADWRE4 | texas instruments | scan test devices with octal d-type latches | Avl | RFQ |
SN74BCT8373ADWR | texas instruments | scan test devices with octal d-type latches | Avl | RFQ |
SN74BCT8373ADWE4 | texas instruments | scan test devices with octal d-type latches | Avl | RFQ |
SN74BCT8373ADW | texas instruments | scan test devices with octal d-type latches | Avl | RFQ |
SN74BCT8373A | texas instruments | scan test devices with octal d-type latches | Avl | RFQ |
SN74BCT8245ANTE4 | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
SN74BCT8245ANT | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
SN74BCT8245AFK | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
SN74BCT8245ADWRG4 | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
SN74BCT8245ADWRE4 | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
SN74BCT8245ADWR | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
SN74BCT8245ADWG4 | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
SN74BCT8245ADWE4 | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
SN74BCT8245ADW | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
SN74BCT8245A | texas instruments | scan test devices with octal bus transceivers | Avl | RFQ |
SN74BCT8244ANTE4 | texas instruments | scan test devices with octal buffers | Avl | RFQ |
SN74BCT8244ANT | texas instruments | scan test devices with octal buffers | Avl | RFQ |
SN74BCT8244ADWRG4 | texas instruments | scan test devices with octal buffers | Avl | RFQ |
SN74BCT8244ADWRE4 | texas instruments | scan test devices with octal buffers | Avl | RFQ |
SN74BCT8244ADWR | texas instruments | scan test devices with octal buffers | Avl | RFQ |
SN74BCT8244ADWG4 | texas instruments | scan test devices with octal buffers | Avl | RFQ |
SN74BCT8244ADWE4 | texas instruments | scan test devices with octal buffers | Avl | RFQ |
SN74BCT8244ADW | texas instruments | scan test devices with octal buffers | Avl | RFQ |
SN74BCT8244A | texas instruments | scan test devices with octal buffers | Avl | RFQ |
SN74BCT8240ANTE4 | texas instruments | scan test devices with octal inverting buffers | Avl | RFQ |
SN74BCT8240ANT | texas instruments | scan test devices with octal inverting buffers | Avl | RFQ |
SN74BCT8240ADWRE4 | texas instruments | scan test devices with octal inverting buffers | Avl | RFQ |
SN74BCT8240ADWR | texas instruments | scan test devices with octal inverting buffers | Avl | RFQ |
SN74BCT8240ADWE4 | texas instruments | scan test devices with octal inverting buffers | Avl | RFQ |
SN74BCT8240ADW | texas instruments | scan test devices with octal inverting buffers | Avl | RFQ |
SN74BCT8240A | texas instruments | scan test devices with octal inverting buffers | Avl | RFQ |
SN74ACT8990FNR | texas instruments | test-bus controllers ieee std 1149.1 jtag tap masters with 16-bit generic host interfaces | Avl | RFQ |
SN74ACT8990FN | texas instruments | test-bus controllers ieee std 1149.1 jtag tap masters with 16-bit generic host interfaces | Avl | RFQ |
SN74ACT8990 | texas instruments | test-bus controllers ieee std 1149.1 jtag tap masters with 16-bit generic host interfaces | Avl | RFQ |
SN74ABTH18652APM | texas instruments | scan test devices with 18-bit bus transceivers and registers | Avl | RFQ |
SN74ABTH18652A | texas instruments | scan test devices with 18-bit bus transceivers and registers | Avl | RFQ |
SN74ABTH18646APM | texas instruments | scan test devices with 18-bit transceivers and registers | Avl | RFQ |
SN74ABTH18646A | texas instruments | scan test devices with 18-bit transceivers and registers | Avl | RFQ |
SN74ABTH18504APM | texas instruments | scan test devices with 20-bit universal bus transceivers | Avl | RFQ |
SN74ABTH18504A | texas instruments | scan test devices with 20-bit universal bus transceivers | Avl | RFQ |
SN74ABTH18502APMR | texas instruments | scan test devices with 18-bit universal bus transceivers | Avl | RFQ |
SN74ABTH18502APMG4 | texas instruments | scan test devices with 18-bit universal bus transceivers | Avl | RFQ |
SN74ABTH18502APM | texas instruments | scan test devices with 18-bit universal bus transceivers | Avl | RFQ |
SN74ABTH18502A | texas instruments | scan test devices with 18-bit universal bus transceivers | Avl | RFQ |
SN74ABTH182652APM | texas instruments | scan test devices with 18-bit bus transceivers and registers | Avl | RFQ |
SN74ABTH182652A | texas instruments | scan test devices with 18-bit bus transceivers and registers | Avl | RFQ |
SN74ABTH182646APM | texas instruments | scan test devices with 18-bit transceivers and registers | Avl | RFQ |
SN74ABTH182646A | texas instruments | scan test devices with 18-bit transceivers and registers | Avl | RFQ |
SN74ABTH182504APM | texas instruments | scan test devices with 20-bit universal bus transceivers | Avl | RFQ |
SN74ABTH182504A | texas instruments | scan test devices with 20-bit universal bus transceivers | Avl | RFQ |
SN74ABTH182502APM | texas instruments | scan test devices with 18-bit universal bus transceivers | Avl | RFQ |
SN74ABTH182502A | texas instruments | scan test devices with 18-bit universal bus transceivers | Avl | RFQ |
SN74ABT8952DWRG4 | texas instruments | scan test devices with octal registered bus transceivers | Avl | RFQ |
SN74ABT8952DWRE4 | texas instruments | scan test devices with octal registered bus transceivers | Avl | RFQ |
SN74ABT8952DWR | texas instruments | scan test devices with octal registered bus transceivers | Avl | RFQ |
SN74ABT8952DWG4 | texas instruments | scan test devices with octal registered bus transceivers | Avl | RFQ |
SN74ABT8952DWE4 | texas instruments | scan test devices with octal registered bus transceivers | Avl | RFQ |
SN74ABT8952DW | texas instruments | scan test devices with octal registered bus transceivers | Avl | RFQ |
SN74ABT8952DLRG4 | texas instruments | scan test devices with octal registered bus transceivers | Avl | RFQ |
SN74ABT8952DLR | texas instruments | scan test devices with octal registered bus transceivers | Avl | RFQ |
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